VNA and resonator systems: Precision dielectric properties measurement for high-frequency applications

Fraunhofer IKTS offers a comprehensive suite of vector network analyzers (VNA) and resonators that meet the requirements for high-frequency measurements below 20 GHz. We specialize in solutions for characterizing a wide range of cylindrical and rectangular samples made of low-loss ceramics and polymers, using cavity resonators (< 20 GHz) and split post dielectric resonators (5, 10 and 15 GHz), enabling precise analysis and optimization for diverse RF applications.

• Relative Permittivity (ε_r) : Accuracy of measurement of a sample of thickness h and diameter d. (Δε/ε=T*Δh/h+(2-T) *Δd/d for 0 < T < 2); T measurement accuracy constant
• Dielectric loss (tanδ): Accuracy of measurement Δtanδ=±2*10^-6 or ±0.03*tanδ which is higher
• Sample dimension:  8-15 mm diameter (d) and 4-7.5 mm thickness (h) (D/h ratio is 2)

• Relative Permittivity (ε_r) at 5, 10 and 15 GHz: Accuracy of measurements of a sample of thickness h; Δε/ε=± (0.0015 + Δh/h)
• Dielectric loss (tanδ) at 5, 10 and 15 GHz: Accuracy of measurement Δtanδ=±2*10^-5 or ±0.03*tanδ which is higher
• Sample dimensions: (Substrates: 30 x 30 x < 0.5 mm// cylindrical: 30 mm x < 0.5 mm)

Split-Post Dielectric Resonators (SPDR) at 5, 10 and 15 GHz (from left to right).

• Sample preparation (cylindrical and substrate samples in required dimensions)
• Relative permittivity and dielectric loss measurements at < 20 GHz
• Temperature variable measurements (-50 to 100°C)
• Measurement reports