Advanced modular electronics and software enable the maximum performance of the sensor technology to be exploited. With the PCUS® pro device family, the Fraunhofer IKTS offers an ultrasonic electronics solution that is suitable for applications ranging from manual hand-held ultrasonic testing to automated ultrasonic testing systems.
All PCUS® pro devices are compact, energy-efficient and comply with the respective relevant parts of the ultrasonic standards ISO 22232-1 and ISO 18563-1. The modular set-up allows for an adaptation of the equipment to suit the testing task at hand, all with only minimal development effort. The connection of any numbers of PCUS® pro devices to desktop, laptop or tablet PC gets easy with USB. The compact design is ideal for sensor-near applications.
PCUS® pro Single is a handy ultrasonic frontend which together with a standard PC makes an ultrasonic testing system. All the components required for signal generation, measurement and processing are included in a small housing. PCUS® pro Single is the ideal solution for manual testing, automated single-channel testing, as well for education and research purposes.
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PCUS® pro Multi is a 16-channel ultrasonic frontend for fully automated ultrasonic testing with several transducers. Thanks to the USB 2.0 interface and the ability to compress the measured data, very fast measurements become possible in the industrial environment, e.g. in sheet metal testing or hollow shaft testing for rail vehicles. With its modular structure PCUS® pro Multi can be adapted to almost any inspection task.
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PCUS® pro Array enables fast automated phased-array ultrasonic testing in industrial environments, e.g. in railway construction or automotive engineering. The test system is ideally suited for weld seams, adhesive joints or other test areas that are difficult to access. Thanks to the large bandwidth and the high scanning rate, CFRP and GFRP structures can be tested as well.
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PCUS® pro Array II is the further development of the PCUS® pro Array electronic unit for particularly fast phased-array testing with many elements. The fully parallel design and the SuperSpeed USB 3.0 interface enable highest scanning rates. The bipolar transmitter pulse enables an even better signal-to-noise ratio.
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