Post Processes

Topic

Assembly of discrete components (SMD) with state of the art technologies:

  • Wire bonding,
  • Reflow soldering,
  • Silver sintering,
  • Adhesives,
  • Direct writing (see Aerosol-printing)

Separating:

  • Wafer dice
  • Laser
  • Polishing
  • Thinfilm compatible surfaces (Ra < 50 nm)

Characterization & Verification:

  • Visual Inspection
  • Surface measurement
  • Non-destructive testing
  • Ultrasonic-microscopy
  • computer tomography
  • X-ray

Thermo-cycling and thermal tests

  • Short- and long term
  • Humidity-Heat-tests

Avalanche voltage measurement

Isolation tests